| 摘要 |
PURPOSE:To analyze the structure of a single-crystal sample by recording a number of diffraction peak data of the single-crystal sample in an accumulation fluorescence body at once and determining the unit lattice and the crystal orientation of a crystal automatically without erecting the sample. CONSTITUTION:X rays are applied to a single-crystal sample 28 which is mounted to a sample-holding device 18 and the diffraction X-rays from it are recorded in an accumulation fluorescent body 12. The sample 28 can be rotated freely around omega axis (sample rotary axis) freely and further can stop only at positions of 0 deg.C and 180 deg.C around the phi axis which is inclined by 45 degrees for the phi axis. First, the sample 28 is set to phi=0 deg.C and then n vibration photos and two Weissenberg photos are recorded under specific omega rotation conditions. Then, the sample 28 is set to phi=180 deg.C and then n vibration photos are taken under specific omega rotation conditions. The crystal orientation is determined and crystal structure is analyzed based on the above data. |
