发明名称 |
PATTERN FORMATION AND MASK |
摘要 |
PURPOSE:To provide the pattern formation which can improve contrast while a subpeak is suppressed small in the transfer technology which uses a phase shift mask with a fine pattern of a super LSI, etc. CONSTITUTION:The pattern formation in which patterns which are arrayed at least in one direction are transferred by using a phase shift mask includes a process wherein exposure is performed by using a phase shift mask whose main hole 1 and phase shifters 2 and 3 on it are reduced size in the array direction of the patterns on the basis of a desired pattern as compared with those in other directions and a process wherein development is carried out at such a level that the light of interference between the phase shifter 2 and 3 is not developed. |
申请公布号 |
JPH06130646(A) |
申请公布日期 |
1994.05.13 |
申请号 |
JP19920277569 |
申请日期 |
1992.10.15 |
申请人 |
FUJITSU LTD |
发明人 |
HARUKI TAMAE;NAKAGAWA KENJI |
分类号 |
G03F1/29;G03F1/68;H01L21/027 |
主分类号 |
G03F1/29 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|