发明名称 PATTERN FORMATION AND MASK
摘要 PURPOSE:To provide the pattern formation which can improve contrast while a subpeak is suppressed small in the transfer technology which uses a phase shift mask with a fine pattern of a super LSI, etc. CONSTITUTION:The pattern formation in which patterns which are arrayed at least in one direction are transferred by using a phase shift mask includes a process wherein exposure is performed by using a phase shift mask whose main hole 1 and phase shifters 2 and 3 on it are reduced size in the array direction of the patterns on the basis of a desired pattern as compared with those in other directions and a process wherein development is carried out at such a level that the light of interference between the phase shifter 2 and 3 is not developed.
申请公布号 JPH06130646(A) 申请公布日期 1994.05.13
申请号 JP19920277569 申请日期 1992.10.15
申请人 FUJITSU LTD 发明人 HARUKI TAMAE;NAKAGAWA KENJI
分类号 G03F1/29;G03F1/68;H01L21/027 主分类号 G03F1/29
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