发明名称 Measuring method for ellipsometric parameter and ellipsometer
摘要 Movable optical parts included in an ellipsometer are removed to increase the measurement speed, and a specific quadrant to which a phase difference DELTA as an ellipsometric parameter belongs is determined by one measuring operation. A beam is radiated from a light source section onto a measurement target, and the reflected beam having an elliptically polarized beam, which is reflected by the target, is divided into four different polarized light components. The optical intensities of the respective light components are then detected. Ellipsometric parameters psi and DELTA are calculated on the basis of the detected four optical intensities. In addition, the above-mentioned four different polarized light components are obtained by using a wave plate. Furthermore, the polarization directions of the four polarized light components whose optical intensities are obtained are respectively set at angles -45 DEG , +45 DEG , 90 DEG , and 0 DEG with respect to a reference direction. Alternatively, a composite beam splitter is used to obtain four polarized light components.
申请公布号 US5311285(A) 申请公布日期 1994.05.10
申请号 US19910816594 申请日期 1991.12.31
申请人 NKK CORPORATION 发明人 OSHIGE, TAKAHIKO;YAMADA, TAKEO;KAZAMA, AKIRA
分类号 G01B11/06;G01J4/04;G01N21/21;(IPC1-7):G01B11/06 主分类号 G01B11/06
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