| 摘要 |
<p>A static random access memory (30), resistant to soft error from alpha particle emissions has a high density array of memory cells (44) coupled to word lines (73 and 74) and bit line pairs (68), and operates at low power supply voltages (for example, 3.3 volts). A charging circuit (55) boosts a supply voltage to the memory array above the power supply voltage. The charging circuit (55) includes an oscillator (57), a charge pump (56), and a voltage regulator (58). The boosted supply voltage reduces the effect of an alpha particle hitting the memory array (44) at low power supply voltages. Providing a boosted supply voltage to the memory array (44) improves soft error resistance without adding capacitance to each memory cell (52 and 54). <IMAGE></p> |
