发明名称 In situ resist control during spray and spin in vapor.
摘要 <p>Spin coating of resist on a semiconductor wafer is done in a controlled chamber, starting with introducing a resist solvent vapor into the chamber from a nozzle, applying the resist by spraying a very thin layer of the resist material, monitoring and adjusting the resist thickness during spinning in vapor, and then removing solvent from the chamber. The result is a saving in resist material and enhanced coating uniformity. &lt;IMAGE&gt;</p>
申请公布号 EP0595749(A2) 申请公布日期 1994.05.04
申请号 EP19930480141 申请日期 1993.09.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LIN, BURN JENG
分类号 B05C11/08;B05D1/40;G03F7/16;H01L21/30;(IPC1-7):G03F7/16 主分类号 B05C11/08
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