| 摘要 |
PURPOSE:To improve a measurement limit on a short wavelength side by utilizing an asymmetrically cut monochromator in an EXAFS measurement apparatus. CONSTITUTION:An X-ray focus F, a center of an asymmetrically cut bent crystal monochromator 14 and a center of an opening of a light receiving slit RS are always on a circumference of a Rowland circle 22. A distance x1 from the X-ray focus F to the monochromator 14 is longer than a distance x2 from the monochromator 14 to the light receiving slit RS. Therefore comparing with a case where a conventional symmetrically cut monochromator is used (x1=x2), x2 can be shortened even if x1 is equal to a conventional distance. As a result, an angle scanning range can be widened to a smaller Bragg angle, thereby enabling EXAFS measurement to a shorter wavelength side. |
