发明名称 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE
摘要 <p>PURPOSE:To provide a NAND cell type EEPROM capable of shortening the time required for a writing of data/write verify readout operation without being accompanied by an increase in a power consumption. CONSTITUTION:An EEPROM is provided with a memory cell array 1, which has a charge storage layer and a control gate and is arranged with nonvolatile memory cells on a semiconductor substrate, a row decoder 5, which is provided at the end part in the direction of a word line of this cell array 1 and drives the control gate, and a verify control circuit, which sets a unit write time in the memory cells in a prescribed range of the array 1 to perform a writing of data and thereafter, reads out the data written in the memory cells and in the case where there is a memory cell which is insufficient in the writing, performs a rewriting in the memory cell. In the EEPROM, at the time of a write varify readout operation, a voltage to be applied to a well formed with a transistor having a conductivity type inverse to that of a transistor of the array 1 is set in a voltage higher than a supply voltage in the row decoder 5 and when the operation of the verify control circuit is changed from the writing operation of data to the write verify readout operation, this voltage is prevented from being reduced.</p>
申请公布号 JPH06112443(A) 申请公布日期 1994.04.22
申请号 JP19920262227 申请日期 1992.09.30
申请人 TOSHIBA CORP 发明人 NAKAMURA HIROSHI;TANAKA TOMOHARU;TANAKA YOSHIYUKI;OHIRA HIDEKO
分类号 G11C17/00;G11C16/02;G11C16/06;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 G11C17/00
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