发明名称 Variable capacitor admittance measuring appts., esp. for level probe - contains oscillator supplying measurement capacitance and evaluation circuit controlled by switching signal derived from oscillator
摘要 The measurement capacitance (14) is supplied by an oscillator (1) and is connected to an evaluation circuit controlled by a switching signal derived from the oscillator and delivered via a phase shifter (33). The phase shifter is coupled to and controls an ac-dc converter. The evaluation circuit produces a d.c. signal corresp. to the admittance of the measurement capacitance. The evaluation circuit contains a synchronous demodulator (21-24) with a switch (23) controlled by the switching signal. The switch contacts are held at null potential. USE/ADVANTAGE - Esp. for capacitive level measurement probes. High accuracy with few components.
申请公布号 DE4235243(A1) 申请公布日期 1994.04.21
申请号 DE19924235243 申请日期 1992.10.20
申请人 VEGA GRIESHABER GMBH & CO, 77709 WOLFACH, DE 发明人 RAFFALT, FELIX, 7612 FISCHERBACH, DE;WOEHRLE, SIEGBERT, 7622 SCHILTACH, DE
分类号 G01F23/26;G01R27/26;(IPC1-7):G01R27/26 主分类号 G01F23/26
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