Integrierte Speicherschaltung mit Redundanz und verbesserter Adressierung in Testbetriebsart.,申请号DE19916000796T-传众专利搜索

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发明名称	Integrierte Speicherschaltung mit Redundanz und verbesserter Adressierung in Testbetriebsart.
摘要
申请公布号	DE69100796(T2)	申请公布日期	1994.04.21
申请号	DE19916000796T	申请日期	1991.08.02
申请人	SGS-THOMSON MICROELECTRONICS S.A., GENTILLY, FR	发明人	CONAN, BERTRAND, CABINET BALLOT-SCHMIT, F-75116 PARIS, FR
分类号	G11C29/00;G11C29/24;(IPC1-7):G11C29/00;G06F11/20	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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