发明名称 SILICON WAFER AND ITS CLEANING METHOD.
摘要 A silicon wafer of a diameter larger than eight inches, whose surfaces are not roughed by cleaning with NH4OH-H2O2, and on which devices of higher performances can be fabricated. A thermal oxidation film is formed on the entire surface of a silicon wafer of a diameter larger than eight inches which is prepared by slicing an ingot made through a pulling method. After removing all the thermal oxidation film of the silicon wafer, the whole surface of the wafer is cleaned with NH4OH-H2O2. <IMAGE>
申请公布号 EP0592671(A1) 申请公布日期 1994.04.20
申请号 EP19920914382 申请日期 1992.07.02
申请人 OHMI, TADAHIRO 发明人 OHMI, TADAHIRO
分类号 H01L21/304;H01L21/306;H01L21/316;(IPC1-7):H01L21/304 主分类号 H01L21/304
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