发明名称 SECONDARY ELECTRON DETECTOR
摘要 PURPOSE:To determine the shape of an auxiliary electrode which determines the orbit of secondary electrons emitted from a specimen in regard to the structure of a secondary electron detector for a scanning electron microscope and the like. CONSTITUTION:The shape of an auxiliary electrode 8 is formed into a cylinder, the upper and lower sections of which are made asymmetric about its cylindrical axis. And the auxiliary electrode 8 is electrically insulated from an earthing electrode 3 by a spacer 2 while arbitrary positive voltage is being applied. By this constitution, even when a secondary electron detector is disposed in a place lower or than identical to a place for a specimen, secondary electrons emitted from the specimen can be efficiently converged into a scintillator without being caught by the auxiliary electrode.
申请公布号 JPH06103951(A) 申请公布日期 1994.04.15
申请号 JP19920247617 申请日期 1992.09.17
申请人 HITACHI LTD;HITACHI SCI SYST:KK 发明人 YASUJIMA MASAHIKO;ITO MASUHIRO;OZASA SUSUMU
分类号 G01T1/20;G01T1/28;H01J37/244;H01J37/28;(IPC1-7):H01J37/244 主分类号 G01T1/20
代理机构 代理人
主权项
地址