发明名称 |
SECONDARY ELECTRON DETECTOR |
摘要 |
PURPOSE:To determine the shape of an auxiliary electrode which determines the orbit of secondary electrons emitted from a specimen in regard to the structure of a secondary electron detector for a scanning electron microscope and the like. CONSTITUTION:The shape of an auxiliary electrode 8 is formed into a cylinder, the upper and lower sections of which are made asymmetric about its cylindrical axis. And the auxiliary electrode 8 is electrically insulated from an earthing electrode 3 by a spacer 2 while arbitrary positive voltage is being applied. By this constitution, even when a secondary electron detector is disposed in a place lower or than identical to a place for a specimen, secondary electrons emitted from the specimen can be efficiently converged into a scintillator without being caught by the auxiliary electrode.
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申请公布号 |
JPH06103951(A) |
申请公布日期 |
1994.04.15 |
申请号 |
JP19920247617 |
申请日期 |
1992.09.17 |
申请人 |
HITACHI LTD;HITACHI SCI SYST:KK |
发明人 |
YASUJIMA MASAHIKO;ITO MASUHIRO;OZASA SUSUMU |
分类号 |
G01T1/20;G01T1/28;H01J37/244;H01J37/28;(IPC1-7):H01J37/244 |
主分类号 |
G01T1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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