| 摘要 |
PURPOSE:To provide a test device capable of testing a communication I/F board by one information processor. CONSTITUTION:This device is comprised in such a way that two sheets of same communication INF boards 8. 9 are packaged in the extension slots 13, 14 of the information processor, and the communication terminals of the communication I/F boards 8, 9 are connected with each other via a data transmission line 15 such as a cable or a communication line, etc., and data transmission/ reception for a communication test between the communication I/F boards 8, 9 is executed. Thereby, it is possible to perform the test of the communication INF board 8, 9 by using one information processor as the test device and to attain cost reduction and space saving. |
