THERMAL IMPACT TEST OF ELECTRONIC PARTS,申请号JP19920181303-传众专利搜索

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发明名称	THERMAL IMPACT TEST OF ELECTRONIC PARTS
摘要
申请公布号	JPH0627189(A)	申请公布日期	1994.02.04
申请号	JP19920181303	申请日期	1992.07.08
申请人	ROHM CO LTD	发明人	HASEGAWA MIKI
分类号	G01N3/60;G01R31/00;G01R31/26;(IPC1-7):G01R31/26	主分类号	G01N3/60
代理机构		代理人
主权项
地址

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