发明名称 MANUFACTURE OF SEMICONDUCTOR MEMORY AND RECORDING METHOD FOR SEMICONDUCTOR MEMORY
摘要 PURPOSE:To reduce the decrease of capacitance after reading/writing of 10<15> time without the generation of a space charge due to polarization and inversion by forming a ferroelectric film on an electrode on a semiconductor substrate and applying an electric field between a surface and an electrode and polarizing the ferroelectric film at a temperature below a transition temperature. CONSTITUTION:A silicon dioxide film 102 is formed as a layer insulating film on a silicon substrate 101, and then Pt 104 of a lower electrode is formed through Ti 103 of a contact layer, and polycrystalline PZT 105 polycrystalline/ showing a ferroelectric characteristic is laminated thereon, and after that, heat treatment is applied to the PZT film 105 with a corona discharge in air, and an external voltage 106 is controlled so that a voltage applied to the PZT film becomes 5 volts. Consequently, a dipole moment in each divided region is oriented in the direction of a bias voltage, and the PZT film 105 is polarized. After that, the succeeding processes are carried out in the temperature below the transition temperature of the PZT film.
申请公布号 JPH0621339(A) 申请公布日期 1994.01.28
申请号 JP19920174124 申请日期 1992.07.01
申请人 SEIKO EPSON CORP 发明人 SHIMADA KATSUTO
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L27/04
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