| 摘要 |
PURPOSE:To obtain a semiconductor integrated circuit device, which can apply a scan-test method in test-pattern detection without decreasing the test-pattern detecting rate. CONSTITUTION:This device is constituted of an application circuit 2, wherein scan tests can be applied, a non-application circuit 4, wherein the scan tests cannot be applied, and a control circuit 3, which is provided between the application circuit and the non-application circuit. The control circuit 3 has a F/F group (flip-flop for the scan test), a multiplexer 10, an F/F group 8 and a multiplexer 9. The F/F group 7 receives the signal from the scan-test application circuit. The multiplexer 10 selects the output signal of the F/F and the signal from the test-scan application circuit and supplies the selected signal into the scan-test non-application circuit. The F/F group 8 receives the signal from the scan-test non-application circuit. The multiplexer 9 selects the output signal of the F/F and the signal from the scan-test non-application circuit and supplies the selected signal into the scantest application circuit. |
