AC interconnect test of integrated circuit chips.

摘要

The invention relates to an integrated circuit chip (110) adapted to provide interconnect capability and to an AC interconnect test method for testing the interconnection of at least two chips (110 and 111). Test and control data are scanned in the scan-path of latches (114 and 115) to initialize the AC interconnect test. Subsequently the functional system mode is simulated by applying the functional system clocks via lines (118 and 128).