发明名称 POLISHING METHOD
摘要 PURPOSE:To enable a polishing amount to be adjusted with high accuracy through simple and inexpensive constitution. CONSTITUTION:In a polishing method whereby a sample holder 13 having sample mounting surface faced to the grinder 11 of a polishing device is kept near the grinder 11, and a sample 12 mounted on the sample mounting surface is polished to the predetermined thickness, at least one chip having such thickness as approximately equal to the predetermined post-process thickness of the sample 12 to be polished, and further having a slower polishing rate than the sample 12, is provided on the sample mounting surface in such a way as adjacent to the sample 12. In addition, the polishing method is so constituted that a polishing process continues slightly longer than the scheduled polishing time of the sample 12, thereby polishing the sample 12 to the substantially predetermined thickness.
申请公布号 JPH068132(A) 申请公布日期 1994.01.18
申请号 JP19910157548 申请日期 1991.05.31
申请人 MITSUMI ELECTRIC CO LTD 发明人 WATANABE SHIGEMITSU;ONO TADASHI;SAKAGUCHI SHINICHI;KASAHARA MASAKI
分类号 B24B37/07;H01L21/304 主分类号 B24B37/07
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