发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p>PURPOSE:To restrain that a readout characteristic is changed due to the difference in a distance between a VSS line and each memory cell and to make the readout characteristic uniform. CONSTITUTION:A data signal which has been read out from a memory cell is output after it has been corrected by an operating amplifier 11 in a sense amplifier 3 operated by a signal from a row-address decoder 2. Thereby, a source potential difference which is caused by the difference in a distance between VSS lines 6, 6 and each memory cell is eliminated, anti the readout characteristic of the title memory device is made uniform.</p>
申请公布号 JPH065086(A) 申请公布日期 1994.01.14
申请号 JP19920164810 申请日期 1992.06.23
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHIROTA SHOZO;OTSUKA TAKAHIRO
分类号 G11C17/00;G11C16/06;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/06 主分类号 G11C17/00
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