发明名称 MEMORY CONTROL CIRCUIT
摘要 PURPOSE:To efficiently specify the defective part of a memory by preserving the defective part of the memory by a hardware and providing a circuit for reading out the preserved defective part by a central processing unit in a memory control circuit. CONSTITUTION:An error latch part 12 monitors RAS0#, RAS1# signals 13, CAS0H#, CAS0L#, CAS1L#, and CAS1L# signals 14, a WE# signal 15 and a memory address 16. In such a state, when a parity error signal 17 from a parity comparing part 11 becomes active, the error latch part 12 latches a monitoring signal as error information in the inside. To the memory address 16, a row address and a column address are subjected to time division and supplied and the respective addresses are fetched to the inside of the error latch part 12 by the RAS0#, RAS1# signals 13 and the CAS0H#, CAS0L#, CAS1H# and CAS1L# signals 14.
申请公布号 JPH05342112(A) 申请公布日期 1993.12.24
申请号 JP19920146065 申请日期 1992.06.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MURAZAKI MASANOBU
分类号 G06F11/10;G06F12/16;G11C29/00;G11C29/56 主分类号 G06F11/10
代理机构 代理人
主权项
地址
您可能感兴趣的专利