发明名称 Single crystal growth process for prodn. of silicon single crystal with constant dopant concn. - by melting material in crucible with added impurities, maintaining solid layer and melting from upper portion while drawing
摘要 Process comprises (a) melting single crystal material in a crucible and adding doping impurities; (b) maintaining a solid layer, which solidifies upwardly from the crucible bottom, in co-existence with the overlying molten layer; and (c) melting the solid layer from its upper portion while drawing a single crystal from the molten layer so that single crystal growth occurs with change in the molten layer vol. Solid layer is pref. formed in a certain wt. ratio 'fpo' to the single crystal material at the start of single crystal growth, the single crystal growth operation including a melting the solid layer with a wt. which is a multiple 'alpha' greater than the wt. of the grown single crystal. Value ranges for 'fpo' and 'alpha' and mathematical relationships between 'fpo' and 'alpha' are given. USE/ADVANTAGE - Crystal growth process is used e.g. for growth of P-doped Si single crystals and it suppresses dopant concn. variation in the melt and in the single crystal, giving increased single crystal yield.
申请公布号 DE4319788(A1) 申请公布日期 1993.12.23
申请号 DE19934319788 申请日期 1993.06.15
申请人 SUMITOMO METAL INDUSTRIES, LTD., OSAKA, JP 发明人 FUJIWARA, TOSHIYUKI, OSAKA, JP;KOBAYASHI, SUMIO, OSAKA, JP;MIYAHARA, SHUNJI, OSAKA, JP;KUBO, TAKAYUKI, OSAKA, JP;FUJIWARA, HIDEKI, OSAKA, JP;INAMI, SHUICHI, OSAKA, JP;OKUI, MASAHIKO, OSAKA, JP
分类号 C30B15/04;C30B15/20;C30B15/30;H01L21/208;(IPC1-7):C30B15/20;C30B29/06 主分类号 C30B15/04
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