| 摘要 |
<p>Method and test platforms for the development of an integrated circuit (1) to be used in an application incorporating on the same chip: a signal processor (2), a RAM memory (4), a ROM memory (3) for receiving control software and processing software and specific input/output control peripherals of the application (5). The signal processor (2), the RAM memory (4) and the ROM memory (3) correspond respectively to existing discrete components. The processing software is developped and tested on a test platform including at least said discrete components by means of interface software that controls the platform and automatic test sequencing from a microcomputer.</p> |
