发明名称 |
Anordnung zur Bestimmung der mittleren Hoehe und der raeumlichen Ausbildung von nicht ebenen Oberflaechen |
摘要 |
An arrangement for checking the depth of the charge and for determining the profile of the surface comprises radiation sources and radiation detectors in different planes. he sources are arranged above the uppermost plane of the detectors and the sources of different planes are displaced with respect to each other. Source and detectors are placed at the corners of an octagon. The chronological control is effected by a comparison arrangement compensating the decay of the activity of the radiation sources. |
申请公布号 |
DE1903873(A1) |
申请公布日期 |
1969.11.06 |
申请号 |
DE19691903873 |
申请日期 |
1969.01.27 |
申请人 |
OESTERREICHISCHE STUDIENGESELLSCHAFT FUER ATOMENERGIE GMBH |
发明人 |
FREVERT,DR.ERICH |
分类号 |
G01F23/288 |
主分类号 |
G01F23/288 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|