发明名称 FLAW INSPECTING DEVICE
摘要 PURPOSE:To set a proper discrimination level to an image signal for detecting a flaw. CONSTITUTION:The image signal from an image pickup section 1 is A/D- converted by an A/D converter 2, the gradation data are outputted to a gradation data memory 4, the image signal is converted into binary data by a discrimination section 3 based on the discrimination level. The binary data are stored in a binary data memory 5 and fed to a flaw detection section 6. When the flaw detection section 6 detects a flaw based on the binary data, it outputs the flaw detection signal to the gradation data memory 4 and the binary data memory 5. The gradation data and the binary data are outputted to a display controller 7 from the gradation data memory 4 and the binary data memory 5 when they receive the flaw detection signal, and the gradation and binary image of the flaw based on both data are concurrently displayed on a CRT 8.
申请公布号 JPH05322792(A) 申请公布日期 1993.12.07
申请号 JP19920124968 申请日期 1992.05.18
申请人 OMRON CORP 发明人 OGINO KENJI
分类号 G01B11/30;G01N21/88;G01N21/89;G01N21/892;G06T1/00 主分类号 G01B11/30
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