发明名称 Measuring probe for ohmic surface and volume resistivity - uses replaceable contact pins fitted in two rows to surface of insulating plate
摘要 The probe comprises an insulating plate (1) with 2 rows of spring contact pins (4) perpendicular to the surface of the plate, the contact pins in each row being electrically coupled to one another. Pref. the contact pin rows each extend in a straight line or a zig-zag line. The pins can be fitted to the insulating plate so that they are interchangeable, e.g. by fitting them to a metal rail (3) which is itself interchangeable relative to the insulating plate. ADVANTAGE - Provides accurate resistivity measurement for uneven surfaces.
申请公布号 DE4242585(C1) 申请公布日期 1993.12.02
申请号 DE19924242585 申请日期 1992.12.16
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 ECKARDT, GUENTER, DIPL.-ING., 8500 NUERNBERG, DE;SCHAUFLER, HERMANN, 8520 ERLANGEN, DE;STIELKE, SENNOR, 8520 ERLANGEN, DE
分类号 G01R1/073;(IPC1-7):H01R11/18;G01R27/00 主分类号 G01R1/073
代理机构 代理人
主权项
地址