发明名称 MASK FILM INSPECTING DEVICE
摘要 PURPOSE:To reduce the size and cost of the inspecting device at the time of integrally constituting a defect inspecting section and defect display section for a mask film as the inspecting device. CONSTITUTION:This inspecting device has an inspection table 4 which is mounted with the mask film MF to be inspected and is moved in one direction, the defect inspecting section 6 which is moved in the direction orthogonal with the moving direction of this inspection table and detects the pattern defect of the mask film MF and the defect display section 7 which is moved in the direction parallel with the defect inspecting section 6 and displays the defect at the detected defect point (a label sticking section for sticking the label indicting the defect to the mask film MF). As a result, the driving mechanisms for the defect inspecting section 6 and the defect display section 7 in one direction are commonly used and the mechanisms are simplified.
申请公布号 JPH05313353(A) 申请公布日期 1993.11.26
申请号 JP19920143404 申请日期 1992.05.09
申请人 ASAHI OPTICAL CO LTD 发明人 ONO HIDEAKI
分类号 B65C9/26;G03F1/84;H01L21/027 主分类号 B65C9/26
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