首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Doppelmikroskop zur Beobachtung von Positionsvorgaengen vorzugsweise in der Siliziumplanartechnologie
摘要
申请公布号
DE1572557(A1)
申请公布日期
1970.04.23
申请号
DE19671572557
申请日期
1967.10.19
申请人
ARBEITSSTELLE FUER MOLEKULARELEKTRONIK
发明人
WESTPHAL,DIPL.-PHYS.PETER
分类号
G02B21/00;G02B21/18
主分类号
G02B21/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Method and apparatus for processing substrate and plate used therein
Tensile impact apparatus
Digital/analog broadcast receiver
System and method for a planner and a deduplicating planner
Transceiver coil for auditory prosthesis
Heat-sensitive adhesive material
Lighting or indicating apparatus equipped with a complementary module, for a motor vehicle
Filter cake removal fluid and method
Method and system for early speculative store-load bypass
Rapid prototyping system
Method of and apparatus for increasing the output of a geothermal steam power plant
Cycloalkyl alkanoic acids as intergrin receptor antagonists
Protruding spacers for self-aligned contacts
System and method for improving indoor air quality
Voice over internet protocol service through broadband network
Image forming apparatus
IMPATIENS PLANT NAMED 'DANCHESAL'
Sugar maple named Hawkersmith 1
Object oriented component and framework architecture for signal processing
Methods and apparatus for characterizing board test coverage
