发明名称 DEVICE FOR INFORMING BAD MEMORY CELL IN A SEMICONDUCTOR MEMORY DEVICES
摘要 A semiconductor memory device storing data having a unit of N bits (1) (N is an integer) includes M memory elements (M is an integer and larger than N) each divided into a plurality of blocks each having a plurality of memory cells each storing one-bit data, and M internal bus lines each carrying one-bit data and connected to a corresponding one of the M memory elements. A designating circuit (3) receives an address signal from an external device and designates one of the plurality of blocks of each of the M memory elements so that M blocks are designated by the address signal. A ROM (6; 24a) stores information on whether or not each of the plurality of blocks of each of the M memory elements has a defective memory cell and outputs the information in accordance with the address signal. N external bus lines (4) individually carry one-bit data. A bus line switching circuit (5, 6) determines whether each of the M blocks designated by the designating circuit has a defective memory cell by referring to the information from the ROM, and selectively connects N internal bus lines among the M internal bus lines to the N external bus lines so that one of the M blocks which has a defective memory cell is prevented from being selected and another one of the M blocks is selected.
申请公布号 KR930011107(B1) 申请公布日期 1993.11.24
申请号 KR19900003743 申请日期 1990.03.20
申请人 FUJITSU LTD. 发明人 BABA, FUMIO
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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