| 摘要 |
In order to modify the configuration of an integrated circuit, for example to restrict access by the user to certain functions or certain pieces of data of the circuit, the integrated circuit is provided with a first electronic lock capable of being locked or unlocked during a stage for the testing of the integrated circuit and capable of being irreversibly locked after the end of the testing stage, and a second electronic lock capable of being unlocked only so long as the first lock is unlocked. In this way, the entire circuit can be tested in the form in which it is presented to the user, the locking of the locks being, so to speak, simulated during the test.
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