发明名称 SPECIMEN HEATING DEVICE FOR MEASURING X-RAY DIFFRACTION
摘要 PURPOSE:To achieve a wide-range X-ray diffraction measurement by eliminating an obstacle on an X-ray passage and preventing sagging of heater wires under a high-temperature heating of 2,000 deg.C or higher and at the same time preventing deterioration of heater wires even under oxidation and reduction atmosphere. CONSTITUTION:A heater wire 2 is wound around a furnace body 1 with an X-ray transmission window 11. Then, by coating the surface of the heater wire 2 which is positioned at the peripheral wall part of the furnace body 1 with a heat-resistant coating layer 3, the heater wire 2 is protected from external oxidation and reduction atmosphere. Also, the heater wire 2 which is positioned at the part of the X-ray transmission window 11 is protected against external oxidation and reduction atmosphere by covering a heat-resistant hard coating member 4 and at the same time it is supported by the hard coating member 4, thus preventing sagging of the heater wire 2 under high-temperature heating.
申请公布号 JPH05296949(A) 申请公布日期 1993.11.12
申请号 JP19920129311 申请日期 1992.04.23
申请人 RIGAKU CORP 发明人 OZAWA GIICHI
分类号 G01N23/207;G01N23/20;G21K5/00 主分类号 G01N23/207
代理机构 代理人
主权项
地址