| 摘要 |
The present invention relates to means and methods for testing microelectronic parts and devices including a special fixture that provides a stable support for holding packaged integrated circuit boards and the like at a specially selected angle in an environmental or humidity testing chamber. A plurality of holes are defined into a sloping surface of a plastic block, into which magnets are strategically placed to define a preselected pattern. Packaged parts are then placed on the magnets and secured thereto by the magnetic attraction through the package between the magnet and the lid of the part packaged. Thus mounted, the parts are maintain at a 45 DEG angle and all surfaces are exposed equally to the settling fog within the chamber.
|
