| 摘要 |
<p>PURPOSE:To improve yield by relieving point defect in a two-terminal element which an MIM panel is typical of. CONSTITUTION:n (plural) elements 13 and 5 are formed for one picture element, and n-1 terminal is actually connected to a picture element electrode out of them, then the connected element is selected by the patterns 18 and 19 of the picture element electrode. A process for detecting the defect is provided in the process. Thus, the point defect is relieved and the yield of the panel is improved.</p> |
