发明名称 |
Reverse polysilicon CMOS fabrication |
摘要 |
A CMOS integrated circuit such as a DRAM is fabricated, in which a first layer of polysilicon is used to form transistor gates, and capacitor cell plates are formed from a second polysilicon layer. N-wells are first formed, followed by initial oxide. The application of the CMOS process to the reverse poly technique provides enhanced alignment of critical transistor gates and permits the use of less mask steps in fabricating the CMOS circuit.
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申请公布号 |
US5252504(A) |
申请公布日期 |
1993.10.12 |
申请号 |
US19920835003 |
申请日期 |
1992.02.11 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
LOWREY, TYLER A.;GONZALEZ, FERNANDO;LEE, RUOJIA |
分类号 |
H01L21/8242;H01L27/105;H01L27/108;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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