发明名称 Method for fabricating self-aligned gate diffused junction field effect transistor
摘要 A method for fabricating a self-aligned, gate diffused junction field effect transistor is provided which includes the steps of forming an n-type layer on an indium phosphide, semi-insulating substrate; forming spaced apart source/drain metal contacts on the n-type layer; forming a metal gate on the n-type layer between the spaced apart source/drain contacts, where the metal gate is insulated from the source/drain contacts and includes a metallic p-type dopant material; and forming a p-type region in the n-type layer beneath the metal gate so that the gate contact and the p-type region have coincident boundaries with respect to each other at the surface of the n-type layer. The method may also be employed to manufacture a bipolar transistor by allowing the self-aligned and diffused p-type region to extend through the n-type layer to the semi-insulating substrate.
申请公布号 US5248626(A) 申请公布日期 1993.09.28
申请号 US19920937916 申请日期 1992.08.28
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 NGUYEN, RICHARD;HEWETT, CHARLES A.
分类号 H01L21/225;H01L21/331;H01L21/337;H01L29/10;H01L29/45 主分类号 H01L21/225
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