发明名称 Semiconductor well structure and method.
摘要 A method of forming doped well regions in a semiconductor layer 14 is disclosed herein. At least one n-doped region 30 and at least one p-doped region 36 are formed in the semiconductor layer 14. The n-doped region 30 is separated from the p-doped region 36 by a separation region. An oxide layer 32 (38), for example silicon dioxide, is formed over the n-doped region 30 and p-doped region (36) but not over the separation region. The semiconductor layer 14 is then heated (e.g., at a temperature of less than 1150 DEG C) in a nitridizing environment such as ammonia. Other structures and methods are also disclosed. <IMAGE>
申请公布号 EP0561167(A2) 申请公布日期 1993.09.22
申请号 EP19930102537 申请日期 1993.02.18
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MOSLEHI, MEHRDAD M.
分类号 H01L21/324;H01L21/033;H01L21/22;H01L21/225;H01L21/266;H01L21/8238;H01L27/08;H01L27/092 主分类号 H01L21/324
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