发明名称 Semiconductor device having a high controllable maximum current, and method for fabricating it
摘要 The invention relates to a semiconductor device. According to the invention, in a surface of a layer (2) of the n- type which is formed on a substrate (1) of the p+ type, diffusion regions (3a, 3b and 3c) of the p type are formed which are separated by diffusion regions (4a, 4b) of the n+ type, and an oxidation film (9); above the regions (3a and 3b) are formed gate electrodes (5a and 5b) which are insulated from the environment by an oxidation film (6); an electrode (7) made of Al-Si is in contact with the diffusion region (3a) of p type, and the diffusion region (4a) of n+ type, while a metal electrode (8) is in contact with the substrate (1) of p+ type. The invention makes it possible particularly to make the controllable current high without exerting a harmful effect on other characteristics of the device. <IMAGE>
申请公布号 FR2688631(A1) 申请公布日期 1993.09.17
申请号 FR19920014047 申请日期 1992.11.23
申请人 MITSUBISHI DENKI KK 发明人 TERASHIMA TOMOHIDE;MAJUMDAR GOURAB
分类号 H01L29/78;H01L21/332;H01L21/336;H01L29/06;H01L29/74;H01L29/749;(IPC1-7):H01L29/74 主分类号 H01L29/78
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