发明名称 MANUFACTURING METHOD OF SEMICONDCUTOR SUBSTRATE HAVING COMPOSITE LAYER
摘要 The method for forming the chemical semiconductor layer with constant width on the single crystal silicon wafer comprises steps: (a) forming 1st and 2nd chemical semiconductor epitaxial layers; (b) forming the low temp. oxide layer and the polycrystal silicon layer; (c) forming groove by etching the all of layers; (d) forming the low temp. silicon oxide layer; (e) forming the low temp. silicon oxide layer on both side of the groove by etching; (f) polishing the exposed polycrystal silicon layer; (g) adhering the backside of the polycrystal silicon layer to the single crystal silicon wafer, and thermal treating and (h) exposing the 1st and 2nd chemical semiconductor epitaxial layers.
申请公布号 KR930008861(B1) 申请公布日期 1993.09.16
申请号 KR19910007963 申请日期 1991.05.16
申请人 KOREA ELECTORNICS & TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KANG, SANG - WON;LEE, KYONG - SU
分类号 H01L21/02;H01L21/20;H01L21/76;H01L21/8252;H01L29/84;(IPC1-7):H01L21/320 主分类号 H01L21/02
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