发明名称 DEPOSITION FILM FORMING METHOD USING MICROWAVE PLASMA CVD METHOD AND ROLL-TO-ROLL METHOD
摘要 PURPOSE:To form an ideal junction surface, by continuously changing the concentration of either one element out of a plurality of elements in a film forming space, and making the concentration have an extremal value at a specified portion in the film forming space. CONSTITUTION:The arrangement of holes formed in the bottom part of a film forming space is characteristic. When an alpha-SiGe film which has the smallest band gap, i.e., the highest Ge content, in the vicinity of a gas discharging vent is to be obtained, exhaust vents are concentrically arranged at the portion corresponding to said film. From gas discharging vents 112a-112d, SiH4 gas and GeH4 gas are made to flow while the flow rates are suitably adjusted, and microwave is introduced into all applicators 110a-110d. When a film is deposited in the above state, the Ge content in the film forming space is made zero, and a film whose band gap is indentical to that of a-Si can be formed. Thereby an ideal junction surface can be formed.
申请公布号 JPH05234918(A) 申请公布日期 1993.09.10
申请号 JP19920072522 申请日期 1992.02.21
申请人 CANON INC 发明人 YOSHINO TOSHIHITO;KANAI MASAHIRO;FUJIOKA YASUSHI;YOSHISATO SUNAO;OKABE SHOTARO;SAKAI AKIRA
分类号 H01L21/205;H01L31/04 主分类号 H01L21/205
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