发明名称 Curvature correction
摘要 In a dual beam atomic absorption spectrometer having a dedicated microcomputer, improved calibration constants are obtained from either two or three known concentration values by finding a number of constants equal to the number of samples such that when the excess over one of the absorbance of that sample of known concentration multiplied by a second constant is divided into the first constant times the absorbance raised to a power one less than the number of samples or in the case of three samples the difference between that value and a third constant times the absorbance, for each measured sample, the result is equal to the known concentration of the sample.
申请公布号 US4238830(A) 申请公布日期 1980.12.09
申请号 US19790062825 申请日期 1979.08.01
申请人 PERKIN-ELMER CORP THE 发明人 UNVALA, HOSHANG A
分类号 G01N21/31;G06F17/00;(IPC1-7):G06F15/20;G01J3/42 主分类号 G01N21/31
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