发明名称 XXRAY ANALYZING DEVICE
摘要 PURPOSE:To simply and quickly perform quantitative analysis by detecting the plug-reflected X-rays by the vibrating rotation of spectral crystal with a detector fixed in the angular position corresponding to a specified element. CONSTITUTION:The X-rays generated from a X-ray tube 17 are projected on a sample 18. The motor shown in the schematic drawing is made to rotate by a cam 15 to vibrate a rotary axis 8, whereby the spectral crystal is scanned in the desired angular range. Then the X-rays, which have satisfied a plug condition, incide in a detector 5a and also in the detector 5b. Consequently from the output signals from the detectors 5a and 5b the quantity of the elements corresponding to the incident wave-length can be made known. In this way, if the angular positions of the detectors 5a, 5b are regulated in advance according to the elements to be measured, the quantitative analysis of the desired elements can simply and quickly be performed.
申请公布号 JPS55163444(A) 申请公布日期 1980.12.19
申请号 JP19790070729 申请日期 1979.06.06
申请人 NIPPON X RAY KK 发明人 SATOU MUTSUMI
分类号 G01N23/223;G01N23/207;G01N23/22 主分类号 G01N23/223
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