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发明名称
INTEGRATED CIRCUIT CHIP WITH BUILT-IN SELF-TEST FOR LOGIC FAULT DETECTION
摘要
申请公布号
US5239262(A)
申请公布日期
1993.08.24
申请号
US19920839418
申请日期
1992.02.21
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
GRUTZNER, MATTHIAS;STARKE, CORDT W.
分类号
G01R31/28;G01R31/3183;G06F11/22;G06F11/27
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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