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发明名称
METHOD OF MEASURING HIGH INSULATING PROOF-VOLTAGE OF RESIN-MOLDED SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH05209932(A)
申请公布日期
1993.08.20
申请号
JP19920007162
申请日期
1992.01.20
申请人
NEC CORP
发明人
OBUCHI SHIGEKI
分类号
G01R31/12;G01R31/26
主分类号
G01R31/12
代理机构
代理人
主权项
地址
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