PATTERN GENERATOR FOR SEMICONDUCTOR TEST DEVICE,申请号JP19920016274-传众专利搜索

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发明名称	PATTERN GENERATOR FOR SEMICONDUCTOR TEST DEVICE
摘要
申请公布号	JPH05209938(A)	申请公布日期	1993.08.20
申请号	JP19920016274	申请日期	1992.01.31
申请人	MITSUBISHI ELECTRIC CORP	发明人	MORI NAGAYA
分类号	G01R31/3183;G01R31/28	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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