发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE:To provide a semiconductor device wherein deterioration during the flattening process of a layer insulating film of the characteristic of an oxidizable electrode formed of an easily oxidizable material is small in a semiconductor device in which a multilayer interconnection is formed on a semiconductor substrate. CONSTITUTION:The title semiconductor device includes the following: a semiconductor substrate 1 which forms a semiconductor element; an oxidizable electrode 3 which is arranged at the upper part of the semiconductor substrate and which is formed of an oxidizable material; an oxidation-resistant layer 5 which is arranged so as to cover the oxidizable electrode 3 and which is formed of a material stopping the passage of oxygen; and a layer insulating film 7 formed on the oxidation-resistant layer 5. |
申请公布号 |
JPH05206401(A) |
申请公布日期 |
1993.08.13 |
申请号 |
JP19920011430 |
申请日期 |
1992.01.24 |
申请人 |
FUJITSU LTD |
发明人 |
KANAZAWA KENICHI;CHIJIIWA MASAHIRO |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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