发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PURPOSE:To provide a semiconductor device wherein deterioration during the flattening process of a layer insulating film of the characteristic of an oxidizable electrode formed of an easily oxidizable material is small in a semiconductor device in which a multilayer interconnection is formed on a semiconductor substrate. CONSTITUTION:The title semiconductor device includes the following: a semiconductor substrate 1 which forms a semiconductor element; an oxidizable electrode 3 which is arranged at the upper part of the semiconductor substrate and which is formed of an oxidizable material; an oxidation-resistant layer 5 which is arranged so as to cover the oxidizable electrode 3 and which is formed of a material stopping the passage of oxygen; and a layer insulating film 7 formed on the oxidation-resistant layer 5.
申请公布号 JPH05206401(A) 申请公布日期 1993.08.13
申请号 JP19920011430 申请日期 1992.01.24
申请人 FUJITSU LTD 发明人 KANAZAWA KENICHI;CHIJIIWA MASAHIRO
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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