发明名称 PROCESS AND APPARATUS FOR THE QUALIFICATION OF A CAPACITIVE SYSTEM
摘要 During a first period, the capacitive system to be qualified is polarized so as to be in the initial state (which can be accumulation or inversion in the case of a capacitive MIS semiconductor system). During a second period, the system is polarized so as to be in the depletion state with constant capacitance. As from a determined instant during the second period, the capacitive value of the system is recorded. This value serves as a reference for the servocontrol of the variation of the polarization voltage maintaining the capacitive system in the depletion state. The measurement of the servocontrol voltage makes it possible to obtain the desired qualification.
申请公布号 US5233307(A) 申请公布日期 1993.08.03
申请号 US19920852812 申请日期 1992.03.17
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 TOFFOLI, ALAIN;PELLOIE, JEAN-LUC
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址