发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To provide a lower gate structure TFT transistor with little variation in characteristics and with high reliability, in which a thin TFT channel part and thick TFT source-drain part can be formed and source-drain and offset can be formed in self-aligning manner with a gate electrode. CONSTITUTION:In a lower gate structure TFT transistor, a channel part 207 is formed to a film thickness thinner than that of a source-drain part 206 and not only source-drain but also offset is formed in self-aligning manner with a gate electrode.
申请公布号 JPH05190856(A) 申请公布日期 1993.07.30
申请号 JP19920001442 申请日期 1992.01.08
申请人 SEIKO EPSON CORP 发明人 KOBAYASHI IZUMI
分类号 H01L27/11;H01L21/336;H01L21/8244;H01L29/78;H01L29/786 主分类号 H01L27/11
代理机构 代理人
主权项
地址
您可能感兴趣的专利