发明名称 |
Surface inspection apparatus and method |
摘要 |
An apparatus for inspecting a reflective surface of an article for defects includes a point light source for generally uniformly illuminating the entire surface of the article under inspection, and a diffusing screen for intercepting the light rays reflected from the surface under inspection of the article. The intercepted light rays produce a high resolution image on the screen consisting of bright and dark areas or spots corresponding to surface defects in the article under inspection.
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申请公布号 |
US5225890(A) |
申请公布日期 |
1993.07.06 |
申请号 |
US19910783949 |
申请日期 |
1991.10.28 |
申请人 |
GENCORP INC. |
发明人 |
LEE, CHING-CHIH;ROACH, JAMES F. |
分类号 |
G01N21/88;G01N21/89 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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