发明名称 Surface inspection apparatus and method
摘要 An apparatus for inspecting a reflective surface of an article for defects includes a point light source for generally uniformly illuminating the entire surface of the article under inspection, and a diffusing screen for intercepting the light rays reflected from the surface under inspection of the article. The intercepted light rays produce a high resolution image on the screen consisting of bright and dark areas or spots corresponding to surface defects in the article under inspection.
申请公布号 US5225890(A) 申请公布日期 1993.07.06
申请号 US19910783949 申请日期 1991.10.28
申请人 GENCORP INC. 发明人 LEE, CHING-CHIH;ROACH, JAMES F.
分类号 G01N21/88;G01N21/89 主分类号 G01N21/88
代理机构 代理人
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