发明名称 Semiconductor device - comprises silicon@ layer, and foreign atom layer contg. boron ions
摘要 Semiconductor device comprises: (a) a Si layer; and (b) a 'foreign' atom layer contg. B ions, where a portion of the B ions is contained in a cluster of icosahedric structure each contg. 12 B atoms. The layer (b) is formed in the layer (a). The device is pref. produced by: (i) forming a foreign atom layer on a Si layer in a concn. such that at least a portion of the B ions is present in the form of clusters of an icosahedric structure each contg. 12 B ions; and (ii) forming a functional section using the foreign atom layer formed. ADVANTAGE - The foreign atom layer has a charge carrier that is formed by a low temp. process.
申请公布号 DE4244115(A1) 申请公布日期 1993.07.01
申请号 DE19924244115 申请日期 1992.12.24
申请人 KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP 发明人 MURAKOSHI, ATSUSHI, KAWASAKI, KANAGAWA, JP;MIZUSHIMA, ICHIRO, YOKOHAMA, KANAGAWA, JP
分类号 H01L21/02;H01L21/265;H01L21/28;H01L21/3215;H01L21/70;H01L29/04;H01L29/167 主分类号 H01L21/02
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