发明名称 VERFAHREN ZUR HERSTELLUNG EINES SELBSTJUSTIERT POSITIONIERTEN METALLKONTAKTES.
摘要 The self-adjusting metal gate contact is applied to a semiconductor using an optical photomask technique, at least one dimension of the contact being less than the wavelength of the employed light. Pref. this dimension is between 0.1 and 0.3 micrometer. The contact metal (40) is applied to the semiconductor (1) after covering part of its surface with a masking element and is covered by a lift-off layer (41) before removal of the latter. An insulation layer (60) is applied to their side edges via an etching process and the metal contact (81) is applied between the insulation layer (60) and the surface of the semiconductor (1).
申请公布号 DE3785872(D1) 申请公布日期 1993.06.24
申请号 DE19873785872 申请日期 1987.02.19
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 WILLER, JOSEF, DR., W-8042 OBERSCHLEISSHEIM, DE
分类号 H01L21/28;H01L29/76;H01L29/80;(IPC1-7):H01L21/28 主分类号 H01L21/28
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