发明名称 |
FORMING METHOD OF METAL OXIDE FILM |
摘要 |
The metal oxide film (tantalum oxide film) is mfd. by forming a thin tantalum layer on the silicon wafer by the sputtering method, forming a tantalum oxide film comprising tantalum particles, pores and thin parts by sputtering a tantalum target under the argon and oxygen (80:20) gas atmosphere, and liquid- oxidizing the tantalum oxide film to form a dense film. The storage capacitor is mfd. by forming an aluminium electrode on the obtd. dense film.
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申请公布号 |
KR930005229(B1) |
申请公布日期 |
1993.06.16 |
申请号 |
KR19900019627 |
申请日期 |
1990.11.30 |
申请人 |
HYUNDAI ELECTRONICS CO., LTD. |
发明人 |
BYON, SANG - KI;KIM, ANG - SO |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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