发明名称 FORMING METHOD OF METAL OXIDE FILM
摘要 The metal oxide film (tantalum oxide film) is mfd. by forming a thin tantalum layer on the silicon wafer by the sputtering method, forming a tantalum oxide film comprising tantalum particles, pores and thin parts by sputtering a tantalum target under the argon and oxygen (80:20) gas atmosphere, and liquid- oxidizing the tantalum oxide film to form a dense film. The storage capacitor is mfd. by forming an aluminium electrode on the obtd. dense film.
申请公布号 KR930005229(B1) 申请公布日期 1993.06.16
申请号 KR19900019627 申请日期 1990.11.30
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 BYON, SANG - KI;KIM, ANG - SO
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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