| 摘要 |
PURPOSE:To make it possible to detect the flaw of the surface layer part of a body to be detected in high accuracy without damaging the surface by applying a contact medium on a probe in the atomized state, and wiping the flaw detecting surface with gas jet immediately before the contact with the probe. CONSTITUTION:In a flaw detecting device 14, a tire-type surface-wave probe 16 is brought into rolling contact with the surface of a roll 11. The flaw on the surface layer part of the roll 11 is spirally scanned. A contact-medium atomizing nozzle 30 comprises an inner pipe 31 and an outer pipe 32. Cleaning grinding fluid in the atomized state on the side of a grinding fluid feeding line L1 is applied on the probe 16 by the jetting of compressed air from the outer pipe 32. A gas jet nozzle 40 is a slit-shaped nozzle, which is provided so as to face the flaw detecting surface located immediately before the contact with the probe 16 at the roll 11. The compressed air from a compressed-air feeding line L2 is blown on the flaw detecting surface wider than the scanning width of the probe 16 at the roll 11. The remaining grinding fluid, moisture and the like on the flaw detecting surface are removed and wiped immediately before the contact with the probe 16. |
